V6.107 edit by lijun @ 2024-08-12 1.新增放电历史数据清洗逻辑，针对于放电测试数据末尾测试电流 < 平均电流*...

DELL

2024-08-12 1f663241ed23dfd012ff3369da9d6bdbf5b042b9

 iec61850_forFoShanAES_Model/src/com/battdata_rt/BattStatData.java

@@ -98,6 +98,15 @@
      test_param = new FBS9100_batt_testparam();

   }

   

   public BattStatData()

   {

      mSourceBattDataType = 0;

      mSybSrvCurrChargeDirPos = true;

      init(FBS9100_SysState.IEC61850_SYS_STATE_STOPPED, (byte) BATTSTATE_FLOAT, 0);

		
      test_param = new FBS9100_batt_testparam();

   }

	
   public void setBpm7100RunState(boolean stat) {

      bpm7100_runState = stat;

   }