package com.fgkj.mapper.impl;
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import com.fgkj.dto.BattInf;
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import java.util.List;
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public interface BatttestdatastopMapper{
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public boolean add(Object obj);
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public boolean updatenew(Object obj);
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public boolean update(Object obj);
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//6.1电池充放电管理删除操作
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public boolean del(Object obj);
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//历史监测单体电压折线图
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public List serchByCondition(Object obj);
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//3根据battgroupid和mon_num(电池编号)查测试信息
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public List serchByMonNum(Object obj);
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//1根据与阈值比较得到最新落后信息
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public List serchByLowNew(Object obj);
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//根据与电容阈值比较得到数据是否有效
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public List serchByType(Object obj);
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//2根据落后的数据（数量，编号，电压）
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public List serchByLow(Object obj);
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//根据截止平均电压值
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public List serch(Object obj);
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//1.4得到历史最高电容/平均电容/最低电容/
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public List serchByCap(Object obj);
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//7.1选出落后单体
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public List serchBadBatt(Object obj);
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//查询指定电池组指定单体的实际容量
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public double serchRealCapByMon_num(BattInf binf);
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/*public static void main(String[] args) {
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Batttestdatastop btds=new Batttestdatastop();
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btds.setBattGroupId(1000001);
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btds.setTest_record_count(1);
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BatttestdatastopDAOImpl bi=new BatttestdatastopDAOImpl();
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//List<Batttestdatastop> list=bi.serch(btds);
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List<Batttestdatastop> list=bi.serchByCap(btds);
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for(Batttestdatastop b:list){
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System.out.println(b);
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}
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//System.out.println(new BatttestdatastopDAOImpl().serchByCondition(btds));
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}*/
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}
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